XRD MiniFlex 600

New sixth generation MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure.

Measurements:

• Phase identification;
• Phase quantification (phase ID);
• Percent (%) crystallinity;
• Crystallite size and strain;
• Lattice parameter refinement;
• Rietveld refinement;
• Molecular structure.

Features:

• New 6th generation design;
• Compact, fail-safe radiation enclosure;
• Incident beam variable slit;
• Simple installation and user training;
• Factory aligned goniometer system;
• Laptop computer operation.

Options:

• 8-position autosampler;
• Graphite monochromator;
• D/teX Ultra: silicon strip detector;
• HyPix-400 MF: 2D HPAD detector;
• Air sensitive sample holder;
• Travel case.