X-ray Diffractometer - MiniFlex 600 (Rigaku, Japan)

Description: New sixth generation MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure.
Specifications:
X-ray generator (XG): power source for X-ray generation
Goniometer: measurement unit at 2θ diffraction angle
Detector: D/teX Ultra 1D silicon strip
Control unit: control of counting and measurement
Radiation enclosure: enclosure cabinet of the main unit that provides protection from radiation
Flow rate detector: for monitoring flow rate of cooling water
X-ray tube: sealed-off X-ray tube
Monochromator: graphite
Software: SmartLab Studio II
Maximum power: 600 W
Tube voltage: 40 kV
Tube current: 15 mA
X-ray tube: Cu
Scanning range: 3-145 °
Scanning speed: 0.01-100 °/min
Minimum step width: 0.005 °
Accuracy: ±0.02 °