Scanning Electron Microscope - Prisma E (Thermo Fisher Scientific, US)

Description: Prisma E is a Scanning Electron Microscope (SEM) that produces enlarged images of a variety of specimens, achieving magnification over 100000X and provides high resolution imaging in a digital format. The instrument provides optimum throughput, resolution and automation. This important and widely used analytical tool provides exceptional field of view, requires minimal specimen preparation, and has the ability to combine the technique with X-ray microanalysis.
Specifications:
Resolution: 3.0 nm at 30 kV in high vacuum (10^-2 to 10^-4 Pa)
Magnification: 150000X
Standard detectors: ETD, directional backscattered: ABS/CBS
Stage bias (beam deceleration, optional): -4․000 V to +50 V
Stage: 5-axis motorized eucentric stage, 110 x 110 mm² with a 105 ° tilt range
Sample holder: standard multi-sample SEM holder uniquely mounts directly onto the stage, hosts up to 18 standard stubs (⌀ 12 mm)
Chamber: 340 mm inside width, 12 ports