LabRAM Nano AFM-Raman System
Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer. LabRAM HR Nano offers full automation and versatile compatibility with outstanding performance. With capabilities from deep UV to infrared, high spectral resolution, and an extended set of options and accessories.
The advantage of combined Raman and AFM (Atomic Force Microscope) analysis on a single microscope system is acess to enhanced information on sample composition and structure done by collection of physical and chemical information on the same sample area. This allows co-localized AFM/Raman measurements, which is the sequential or simultaneous acquisition of overlapped SPM (Scanning Probe Microscope) and Raman maps with pixel-to-pixel correspondence in the images.
Spectroscopy Modes allowed by the device are:
- Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy
- Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes
- Tip-Enhanced Photoluminescence (TEPL)
- Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)
SPM Measuring Modes
Contact AFM in air/(liquid optional); Non -contact AFM; Phase imaging; Lateral Force Microscopy (LFM); Force Modulation; Conductive AFM (optional); Magnetic Force Microscopy (MFM); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Capacitance and Electric Force Microscopy (EFM); Force curve measurement; Piezo Response Force Microscopy (PFM); Nanolithography; Nanomanipulation; STM (optional); Photocurrent Mapping (optional); Volt-ampere characteristic measurements (optional).